Scanning Electron Microscopy (SEM) can be used to identify damage in building materials, such as corrosion, structural failure and so on, caused mainly by environmental conditions. The dual-beam FIB-SEM system provides valuable information on the subsurface of materials, enabling 3D visualization of these materials. SEM used in combination with BSE and EDX detectors gives access to details of the chemical composition of concrete mixtures, sand and other granular materials.
Image 2: SEM imaging of fly ash