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Textiles
Glass
Your thematics
Identification and localisation of contamination in a microelectronic component
Morphology, topography, chemical composition of glass - SEM/FIB/EDX
Morphology and chemical composition of ceramics - SEM/FIB/EDX
XPS evaluation of oxidation degrees
Morphology, topography, crystal structure, chemical composition of civil engineering materials - SEM
The argon cluster gun, an innovation for XPS profiles of coated glasses
Evaluation by XPS of the contribution of an atmospheric plasma treatment on the extreme surface chem
Imaging the composition of homeopathic granules by ToF-SIMS
Roughness analysis of breast prostheses by PO3D
Identification of contamination in polymers after recycling
3D morphology and mechanical properties of nanoparticles
Localized adhesion mechanisms in an assembly (Tof-SIMS / AFM)
Cleaning of a contaminated surface with the ToF-SIMS argon cluster gun
Identification and localisation of contamination in a microelectronic component
Characterization of single- to multi-layer surface treatments - ToF-SIMS
Determination of the homogeneity of a PDMS plasma treatment on carbon fibres by XPS
Measurement of the recovery rate of a cosmetic treatment on natural skin by XPS
Identification of the chemical nature of polymer film by XPS
Study of the deformation/cracking of a barrier coating on a flexible substrate
Our techniques
AFM
FIB MEB Ga ou Xe
MicroFTIR
Optical profilometry
SEM EDX EBSD
TEM STEM EDX EELS
ToF-SIMS
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XPS/ESCA
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Tescan
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Your applications
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Your thematics
There are many areas of intervention on surfaces and interfaces in materials. You will find below a non-exhaustive list of applications carried out by TESCAN ANALYTICS, classified in alphabetical order.
Our team of experts will assist you in choosing the most appropriate analytical techniques to understand and optimise your manufacturing processes and the final properties of your products. Do not hesitate to ask us for information.
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XPS evaluation of oxidation degrees
Your thematics
Nanoscale study of the electrical properties of semiconducting polymers
Your thematics
The argon cluster gun, an innovation for XPS profiles of coated glasses
Your thematics
Evaluation by XPS of the contribution of an atmospheric plasma treatment on the extreme surface chemistry of a PET
Your thematics
Imaging the composition of homeopathic granules by ToF-SIMS
Your thematics
Roughness analysis of breast prostheses by PO3D
Your thematics
Identification of contamination in polymers after recycling
Your thematics
3D morphology and mechanical properties of nanoparticles
Your thematics
Localized adhesion mechanisms in an assembly
Your thematics
Cleaning of a contaminated surface with the ToF-SIMS argon cluster gun
Your thematics
Identification and localisation of contamination in a microelectronic component
Your thematics
Characterization of single- to multi-layer surface treatments - ToF-SIMS
Your thematics
XPS measurement of the homogeneity of a PDMS plasma treatment on carbon fibers
Your thematics
Measurement by XPS of the recovery rate of a cosmetic treatment on natural skin
Your thematics
Characterization of a polyethylene terephthalate by XPS
Your thematics
Study of the deformation/cracking of a barrier coating on a flexible substrate
Your thematics
Do you have any questions? Do not hesitate to contact us!