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Aerospace
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Microelectronics
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Biomaterials
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Thin layers
Metals
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Textiles
Glass
Your thematics
Identification and localisation of contamination in a microelectronic component
Morphology, topography, chemical composition of glass - SEM/FIB/EDX
Morphology and chemical composition of ceramics - SEM/FIB/EDX
XPS evaluation of oxidation degrees
Morphology, topography, crystal structure, chemical composition of civil engineering materials - SEM
The argon cluster gun, an innovation for XPS profiles of coated glasses
Evaluation by XPS of the contribution of an atmospheric plasma treatment on the extreme surface chem
Imaging the composition of homeopathic granules by ToF-SIMS
Roughness analysis of breast prostheses by PO3D
Identification of contamination in polymers after recycling
3D morphology and mechanical properties of nanoparticles
Localized adhesion mechanisms in an assembly (Tof-SIMS / AFM)
Cleaning of a contaminated surface with the ToF-SIMS argon cluster gun
Identification and localisation of contamination in a microelectronic component
Characterization of single- to multi-layer surface treatments - ToF-SIMS
Determination of the homogeneity of a PDMS plasma treatment on carbon fibres by XPS
Measurement of the recovery rate of a cosmetic treatment on natural skin by XPS
Identification of the chemical nature of polymer film by XPS
Study of the deformation/cracking of a barrier coating on a flexible substrate
Our techniques
AFM
FIB MEB Ga ou Xe
MicroFTIR
Optical profilometry
SEM EDX EBSD
TEM STEM EDX EELS
ToF-SIMS
Tomography X
XPS/ESCA
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Tescan
/
R&D
Staying at the forefront of innovation by developing an R&D activity is a major objective for TESCAN ANALYTICS in order to develop new analysis methods and applications for our customers in all sectors.
We have thus forged close ties with a large network of partners (public and private research centers, competitiveness clusters, associations and companies).
Our integration within the TESCAN ORSAY HOLDING group also allows us to initiate strong synergies with the other subsidiairies of the group and to benefit from the latest innovations in electron microscopy.
We are opened to potential partners for collaborative projects, you can
contact us
to find out more.
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Do you have any questions? Do not hesitate to contact us!