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Evaluation by XPS of the contribution of an atmospheric plasma treatment on the extreme surface chem
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Imaging the composition of homeopathic granules by ToF-SIMS
Identification and localisation of contamination in a microelectronic component
Micrometric scale topography of a watch dial - PO3D
Localized adhesion mechanisms in an assembly (Tof-SIMS / AFM)
Measurement of the recovery rate of a cosmetic treatment on natural skin by XPS
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Cleaning of a contaminated surface with the ToF-SIMS argon cluster gun
The argon cluster gun, an innovation for XPS profiles of coated glasses
Roughness analysis of breast prostheses by PO3D
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Tescan
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8èmes Rencontres Annuelles en Nanométrologie
8èmes Rencontres Annuelles en Nanométrologie
Jun/17/2019 to Jun/17/2019
PARIS, Ministère de l'Enseignement Supérieur et de la Recherche
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LNE and C'Nano are organizing the 8th Annual Nanometrology Meetings. This event will take place on June 17, 2019 at the Ministry of Higher Education, Research and Innovation. TESCAN ANALYTICS, member of the Nanometrology club, will be present.
Do not hesitate to contact us to meet us during this day: contact-analytics@tescan.com
Registrations will be open in a few days !!!