EN
English
France
Toggle navigation
Your industries
Aerospace
Automotive
Microelectronics
Medical device
Pharmaceutical
Cosmetic
Polymer/Plastics processing
Luxury industry
Your applications
Your materials
Biomaterials
Ceramics
Thin layers
Metals
Nanoparticles
Polymers
Semiconductors
Textiles
Glass
Your thematics
Identification and localisation of contamination in a microelectronic component
Morphology, topography, chemical composition of glass - SEM/FIB/EDX
Morphology and chemical composition of ceramics - SEM/FIB/EDX
XPS evaluation of oxidation degrees
Morphology, topography, crystal structure, chemical composition of civil engineering materials - SEM
The argon cluster gun, an innovation for XPS profiles of coated glasses
Evaluation by XPS of the contribution of an atmospheric plasma treatment on the extreme surface chem
Imaging the composition of homeopathic granules by ToF-SIMS
Roughness analysis of breast prostheses by PO3D
Identification of contamination in polymers after recycling
3D morphology and mechanical properties of nanoparticles
Localized adhesion mechanisms in an assembly (Tof-SIMS / AFM)
Cleaning of a contaminated surface with the ToF-SIMS argon cluster gun
Identification and localisation of contamination in a microelectronic component
Characterization of single- to multi-layer surface treatments - ToF-SIMS
Determination of the homogeneity of a PDMS plasma treatment on carbon fibres by XPS
Measurement of the recovery rate of a cosmetic treatment on natural skin by XPS
Identification of the chemical nature of polymer film by XPS
Study of the deformation/cracking of a barrier coating on a flexible substrate
Our techniques
AFM
FIB MEB Ga ou Xe
MicroFTIR
Optical profilometry
SEM EDX EBSD
TEM STEM EDX EELS
ToF-SIMS
Tomography X
XPS/ESCA
Training
Ask a quote
R&D
Collaboration
Partner
Communication
About
Contact
News
Events
Tescan
/
About
/
Events
Upcoming events
Past events
11
2
Textival
Oct/17/2023 to Oct/17/2023
Matmut Stadium, Lyon
Rendez-vous Carnot
Oct/18/2023 to Oct/19/2023
Centre de Congrès - LYON