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  • Your industries
    • Aerospace
    • Automotive
    • Microelectronics
    • Medical device
    • Pharmaceutical
    • Cosmetic
    • Polymer/Plastics processing
    • Luxury industry
  • Your applications
    • Your materials
      • Biomaterials
      • Ceramics
      • Thin layers
      • Metals
      • Nanoparticles
      • Polymers
      • Semiconductors
      • Textiles
      • Glass
    • Your thematics
      • Evaluation by XPS of the contribution of an atmospheric plasma treatment on the extreme surface chem
      • Identification of the chemical nature of polymer film by XPS
      • Characterization of single- to multi-layer surface treatments - ToF-SIMS
      • Aromatic compound mapping - ToF-SIMS
      • Study of the deformation/cracking of a barrier coating on a flexible substrate
      • XPS evaluation of oxidation degrees
      • Determination of the homogeneity of a PDMS plasma treatment on carbon fibres by XPS
      • Identification of contamination in polymers after recycling - ToF-SIMS
      • Imaging the composition of homeopathic granules by ToF-SIMS
      • Identification and localisation of contamination in a microelectronic component
      • Micrometric scale topography of a watch dial - PO3D
      • Localized adhesion mechanisms in an assembly (Tof-SIMS / AFM)
      • Measurement of the recovery rate of a cosmetic treatment on natural skin by XPS
      • 3D morphology and mechanical properties of nanoparticles
      • Morphology, topography and chemical composition of Li-ion batteries
      • Morphology, topography, chemical composition of wood, textile and paper - SEM/FIB/EDX
      • Morphology and chemical composition of ceramics - SEM/FIB/EDX
      • Morphology, topography, crystal structure, chemical composition of civil engineering materials - SEM
      • Morphology, topography, crystal structure, chemical composition of polymers and composites - SEM/FIB
      • Morphology, topography, chemical composition of glass - SEM/FIB/EDX
      • Cleaning of a contaminated surface with the ToF-SIMS argon cluster gun
      • The argon cluster gun, an innovation for XPS profiles of coated glasses
      • Roughness analysis of breast prostheses by PO3D
      • Morphology, granulometry and chemical composition in pharmacology - SEM/FIB/EDX
  • Our techniques
    • AFM
    • FIB MEB Ga ou Xe
    • MicroFTIR
    • Optical profilometry
    • SEM EDX EBSD
    • TEM STEM EDX EELS
    • ToF-SIMS
    • Tomography X
    • XPS/ESCA
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