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Evaluation by XPS of the contribution of an atmospheric plasma treatment on the extreme surface chem
Identification of the chemical nature of polymer film by XPS
Characterization of single- to multi-layer surface treatments - ToF-SIMS
Aromatic compound mapping - ToF-SIMS
Study of the deformation/cracking of a barrier coating on a flexible substrate
XPS evaluation of oxidation degrees
Determination of the homogeneity of a PDMS plasma treatment on carbon fibres by XPS
Identification of contamination in polymers after recycling - ToF-SIMS
Imaging the composition of homeopathic granules by ToF-SIMS
Identification and localisation of contamination in a microelectronic component
Micrometric scale topography of a watch dial - PO3D
Localized adhesion mechanisms in an assembly (Tof-SIMS / AFM)
Measurement of the recovery rate of a cosmetic treatment on natural skin by XPS
3D morphology and mechanical properties of nanoparticles
Morphology, topography and chemical composition of Li-ion batteries
Morphology, topography, chemical composition of wood, textile and paper - SEM/FIB/EDX
Morphology and chemical composition of ceramics - SEM/FIB/EDX
Morphology, topography, crystal structure, chemical composition of civil engineering materials - SEM
Morphology, topography, crystal structure, chemical composition of polymers and composites - SEM/FIB
Morphology, topography, chemical composition of glass - SEM/FIB/EDX
Cleaning of a contaminated surface with the ToF-SIMS argon cluster gun
The argon cluster gun, an innovation for XPS profiles of coated glasses
Roughness analysis of breast prostheses by PO3D
Morphology, granulometry and chemical composition in pharmacology - SEM/FIB/EDX
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AFM
FIB MEB Ga ou Xe
MicroFTIR
Optical profilometry
SEM EDX EBSD
TEM STEM EDX EELS
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Events
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3
FIP 2024
Jun/04/2024 to Jun/07/2024
EUREXPO (hall 5 & 6); Boulevard de l’Europe, 69686 Chassieu
EPHJ 2024
Jun/11/2024 to Jun/14/2024
Palexpo Genève
SIMS 24
Sep/10/2024 to Sep/13/2024
La Rochelle