TESCAN ANALYTICS - Experts in surface and interface analysis

Your industries
Aerospace

Automotive

Microelectronics

Medical device

Pharmaceutical

Cosmetic

Polymer/Plastics processing

Luxury industry
Your applications
Your materials

Biomaterials

Ceramics

Thin layers

Metals

Nanoparticles

Polymers

Semiconductors

Textiles

Glass

Your thematics

Evaluation by XPS of the contribution of an atmospheric plasma treatment on the extreme surface chem

Identification of the chemical nature of polymer film by XPS

Characterization of single- to multi-layer surface treatments - ToF-SIMS

Aromatic compound mapping - ToF-SIMS

Study of the deformation/cracking of a barrier coating on a flexible substrate

XPS evaluation of oxidation degrees

Determination of the homogeneity of a PDMS plasma treatment on carbon fibres by XPS

Identification of contamination in polymers after recycling - ToF-SIMS

Imaging the composition of homeopathic granules by ToF-SIMS

Identification and localisation of contamination in a microelectronic component

Micrometric scale topography of a watch dial - PO3D

Localized adhesion mechanisms in an assembly (Tof-SIMS / AFM)

Measurement of the recovery rate of a cosmetic treatment on natural skin by XPS

3D morphology and mechanical properties of nanoparticles

Morphology, topography and chemical composition of Li-ion batteries

Morphology, topography, chemical composition of wood, textile and paper - SEM/FIB/EDX

Morphology and chemical composition of ceramics - SEM/FIB/EDX

Morphology, topography, crystal structure, chemical composition of civil engineering materials - SEM

Morphology, topography, crystal structure, chemical composition of polymers and composites - SEM/FIB

Morphology, topography, chemical composition of glass - SEM/FIB/EDX

Cleaning of a contaminated surface with the ToF-SIMS argon cluster gun

The argon cluster gun, an innovation for XPS profiles of coated glasses

Roughness analysis of breast prostheses by PO3D

Morphology, granulometry and chemical composition in pharmacology - SEM/FIB/EDX
Our techniques
AFM

FIB MEB Ga ou Xe

MicroFTIR

Optical profilometry

SEM EDX EBSD

TEM STEM EDX EELS

ToF-SIMS

Tomography X

XPS/ESCA
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