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Evaluation by XPS of the contribution of an atmospheric plasma treatment on the extreme surface chem
Identification of the chemical nature of polymer film by XPS
Characterization of single- to multi-layer surface treatments - ToF-SIMS
Aromatic compound mapping - ToF-SIMS
Study of the deformation/cracking of a barrier coating on a flexible substrate
XPS evaluation of oxidation degrees
Determination of the homogeneity of a PDMS plasma treatment on carbon fibres by XPS
Identification of contamination in polymers after recycling - ToF-SIMS
Imaging the composition of homeopathic granules by ToF-SIMS
Identification and localisation of contamination in a microelectronic component
Micrometric scale topography of a watch dial - PO3D
Localized adhesion mechanisms in an assembly (Tof-SIMS / AFM)
Measurement of the recovery rate of a cosmetic treatment on natural skin by XPS
3D morphology and mechanical properties of nanoparticles
Morphology, topography and chemical composition of Li-ion batteries
Morphology, topography, chemical composition of wood, textile and paper - SEM/FIB/EDX
Morphology and chemical composition of ceramics - SEM/FIB/EDX
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Morphology, topography, crystal structure, chemical composition of polymers and composites - SEM/FIB
Morphology, topography, chemical composition of glass - SEM/FIB/EDX
Cleaning of a contaminated surface with the ToF-SIMS argon cluster gun
The argon cluster gun, an innovation for XPS profiles of coated glasses
Roughness analysis of breast prostheses by PO3D
Morphology, granulometry and chemical composition in pharmacology - SEM/FIB/EDX
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Microelectronics
Semiconductors are used in daily life objects and industries/sectors such as microelectronics. Their manufacturing techniques are diverse and innovative in order to reduce more and more its component size. The semiconductor industry is engaged in a frantic race where the goal is high integration, high density and miniaturization of devices (Moore law). This has resulted in the development of new technologies such as 3D integrated circuits that allow extended functionality to be incorporated into increasingly small, fast and low-power devices (FINFET transistors (< 10 nm)).
However, these increasingly complicated circuits require more sophisticated tools for development and prototyping, inspection and failure investigation in order to analyze or reach areas of interest.
These developments require increasingly precise and efficient analytical characterization techniques. Indeed, some parasitic physical effects without consequences on a larger scale become problematic at the submicron level. With our state-of-the-art instruments, we bring you the solution to your analytical problems in the ultra-small world of microelectronics.
BIOPHY RESEARCH has been working on the challenges of the microelectronics sector since their inception.
BIOPHY RESEARCH and its scientific team have been supporting many players in this sector for nearly 30 years. The analytical techniques we use as well as our experience in this field will provide you valuable results in order to monitor your manufacturing processes, qualifying your production tools, understanding failures, etc.
We offer expertise covering all phases: from design to production. Thanks to this understanding of the malfunctions encountered, our partners were able to identify and solve their causes in a short time and at a lower cost.
Analysis of deposits in production equipment, thickness measurement of thin layers, measurement of nanometric components size, stoichiometry analysis of layers of oxides nitrides layers, defects/contaminations analysis on chips, analysis of contaminants in multilayer interfaces, cleaning process efficiency, surface conditioning of silicon wafers, development of new processes (implantation, etching), conformity of deposits in 3D structures, monitoring of volatile organic compounds (VOCs) in clean rooms, dopant implantation profiles in Si, SiOx, SiC... residues of photolitho resins, porosities of thin PVD layers, purity of metallic deposits, pollution of "bondings"...
All these issues and more have been solved by our team. Our complete range of instruments and our expertise allow us to offer you the optimal analytical solution.
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Non-exhaustive list of our application examples in the field of microelectronics:
Do you have any questions? Do not hesitate to contact us!