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The argon cluster gun, an innovation for XPS profiles of coated glasses
Evaluation by XPS of the contribution of an atmospheric plasma treatment on the extreme surface chem
Imaging the composition of homeopathic granules by ToF-SIMS
Roughness analysis of breast prostheses by PO3D
Identification of contamination in polymers after recycling
3D morphology and mechanical properties of nanoparticles
Localized adhesion mechanisms in an assembly (Tof-SIMS / AFM)
Cleaning of a contaminated surface with the ToF-SIMS argon cluster gun
Identification and localisation of contamination in a microelectronic component
Determination of the homogeneity of a PDMS plasma treatment on carbon fibres by XPS
Measurement of the recovery rate of a cosmetic treatment on natural skin by XPS
Identification of the chemical nature of polymer film by XPS
Study of the deformation/cracking of a barrier coating on a flexible substrate
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FIB MEB Ga ou Xe
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