The methodology followed is easily transposable to all types of natural or synthetic fibers. First, a tracer element must be determined to measure and quantify its presence after treatment. In this case, fluorine was chosen as the tracer element because of its presence in the carbon fiber manufacturing process as an extrusion agent.
Giving access to a data matrix spread over a length of several cm, this mode allows to evaluate with precision the homogeneity of a treatment. In XPS, the surface is irradiated by X-ray photons from a monochromatic source. The atoms of the sample emit photoelectrons with energies specific to each element and its environment. The spectra obtained most commonly present the number of photoelectrons detected as a function of their binding energy (difference between the energy of the X-ray photons and the kinetic energy of the emitted electrons). Classically, the surface analyzed by XPS is of the order of a few hundred µm2. The linescan mode, based on a perfectly adapted acquisition software, allows to cover a much larger surface spread over a length of several cm.
In Figure 1, the XPS spectra of the untreated carbon fibers as well as those of the fibers that underwent PDMS treatments 1 and 2 have been superimposed. The recovery rate of the treated carbon fibers can be estimated from the difference in atomic concentrations of fluorine, the tracer element of the fiber, before and after PDMS plasma treatment, from the following formula:
with : [F]average reference: average atomic % of fluorine measured on reference carbon fibers [F]treated fibers: average atomic % of fluorine measured after PDMS treatment The elemental compositions of the fibers are presented in Table 1. The elemental analyses show the detection of fluorine up to 7.9 atomic % on the extreme surface of the untreated carbon fibers. This fluorine is related to residues of fluorinated extrusion agents used in the carbon fiber forming process. After plasma treatment, a decrease in fluorine content is measured for treatment 1 (7.9 % before treatment to 2.9 % after treatment 1). Treatment 2 leads to a total masking of fluorine ([F] = 0 % after treatment 2). These results indicate a total coverage (100%) with treatment 2, the absence of fluorine indicates a PDMS layer thickness greater than 10 nm (XPS analysis depth). Treatment 1, on the other hand, shows 63% coverage, indicating a thickness < 10nm. The statistical approach reveals a better homogeneity with treatment 2 for which lower standard deviations are measured.
In other work, the strength of XPS has been demonstrated for evaluating the homogeneity of an atmospheric plasma chemical functionalization treatment on polymer films.