TescanR&D Dedicated developments

Dedicated developments

We take good care of our customer needs and we can develop special solutions for special applications.

Here are some examples:

Traction module for the observation in real time by AFM or 3D profilometry of the deformation of thin layers on polymeric substrate submitted to traction.
‘Cold finger’ for the analysis by ToF SIMS of volatile compounds in materials surface or in order to realise profiles in depth on materials of low electronic conductivity.
Multi-Ion® software for statistic treatment by analysis of the principle components of abtained data in ToF SIMS.