Our team of experts will accompany you throughout your optical profilometry analysis project, from the formulation of your problem to its resolution.

With state-of-the-art equipment, we will provide you with comprehensive results and a detailed report on which you can discuss with our engineers.

Not sure if optical profilometry is right for you? Do not hesitate to contact us so that together we can find the right technique for your needs.

Optical profilometry principle

Optical profilometry (confocal microscopy/interferometry) is a non-contact imaging method for observing and characterising the topography of surfaces over measurement ranges from tens of µm² to a few mm², with a lateral resolution of 200 nm and depth resolutions from nm to several mm. Conventional analysis provides 2D and 3D images of the surface with the dimensions of the observed features, as well as numerous roughness statistics.

Optical profilometry provides a characterisation of the topography of surfaces (a few tens of µm² to a few mm²)

regardless of the material, shape or colour of the sample.

Different modes can be used to access different levels of information. Confocal microscopy can image all types of samples (flat or very rough, slopes up to 70%). On smooth samples, interferometry allows to reach nanometric vertical resolutions.

Several modes can be used to access the 3D topography of all types of samples.


Acquisition of very shallow depth of field images or "optical sections"
By positioning the focal plane of the lens at different depths in the sample and eliminating all light from out-of-focus points, it is possible to make a series of images from which a three-dimensional representation of the object can be obtained.


In PSI (Phase Shift Interferometry), a few z-shifts corresponding to known phase shifts are applied; they allow the surface to be reconstructed (smooth surfaces, samples with little roughness and steps < 120 nm).

In VSI (Vertical Scanning Interferometry), a vertical scan is performed and the fringe envelope is observed to find the maximum correlation between the waves or focus point (samples with roughness ranging from 50 nm to 1 µm, step heights greater than 120 nm).


Observation and study of cracking or deformation of a coating on a flexible substrate 
A load cell is used to measure the elongation of the sample at the same time as the profilometer acquires the topography results.
The characteristics of the tensile stage are as follows: 
- Adjustable jaw spacing speed from 0.8 mm/min to 25 mm/min.

- Force sensor (range 0-500 N), accuracy 0.1 N.

- Displacement sensor (range 50 mm), accuracy 0.01 mm.

Optical Profiliometry applications

Optical profilometry can be used in all sectors of activity and for all types of materials: polymers, biological samples, powders, metals, glass, etc.
  • Three-dimensional morphological analyses (machining studies, corrosion studies, microparticle structure, monitoring of morphology over time, etc.)
  • Measurement of roughness parameters (ISO 25178 standard, etc.)

Optical Profilometry technical specifications 

  • Lateral resolution: 0.2 µm
  • Vertical resolution: ~ 1 nm
  • Max. image size: 5.3 x 3.8 mm²
  • Min image size: 84 x 63 µm²
  • Maximum roughness: 23 mm
  • Maximum sample size: L x W: 100 x 70 mm²; Max height 5 cm

Optical Profilometry strenghts

  • Large fields of view
  • High dynamic roughness
  • Image acquisition speed
  • Tensile module coupling 
  • Analysis under atmospheric pressure
  • Stitching capability to increase the maximum characterisation size