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Measures of permeability (O2, H2O)
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Techniques
TESCAN ANAYTICS
is your key partner for
materials surface and interface analysis
.
Our expertise in the following analysis techniques brings you a dynamic support to adress issues in material or process conception, development, modification, qualification, production.
XPS / ESCA
ToF-SIMS
AFM
TEM STEM EDX EELS
SEM EDX EBSD
FIB SEM Ga or Xe
Optical profilometry
Wettability, surface energy
Measures of permeability (O2, H2O)
Elemental composition and analysis of chemical forms of surface elements
Molecular detection and identification of contaminants
In-depth distribution of elements
Chemical and molecular image in surface and in 3D
Surface morphology and surface roughness parameters
Measure of thickness of thin films
Mechanical properties (nano-hardness, friction)
Physico-chemical properties (surface energy , wettability, adhesion)