XPS is a very powerful tool, used for Chemical Surface Analysis (quantitative elemental composition and chemical speciation, on the 2-10 first nm), for Chemical Imaging (lateral resolution 3 µm) , and elemental Depth Profiling (up to 1 µm, 3 nm z resolution). Samples analyzed: all UHV compliant materials Insulators (Flood gun), polymers, organic products, biological samples, powders, galss, semiconductor, metal, alloys