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Optical Profilometer
SENSOFAR - PluNEOX
Optical profilometry
is used to get the XYZ topography (structure, roughness, dimensions) of a sample surface for dimensions ranging from 100x100 µm² to a few mm².
Sample analyzed:
all type of solid materials
Analysis area : 100x100 µm² to a few mm²
Vertical (Z) resolution : 0.1 nm
Lateral (XY) re : 200 nm
Déplacement vertical maximal pendant la mesure : 5 µm
Mesures à l'air