Atomic Force Microscope (AFM)

AFM is used to get information on the sample topography, roughness with an X, Y, Z nanomteric resolution ; this technique, based on the contact between a small sensor and the surface, can also give informations about mechanical properties, adhesion properties, electrical or magnetical properties. 

Samples analyzed: all solid or semi solid material types (polymer, powders, metals, lasses, biological samples, textile, fibers, nanoparticles)
 

BRUKER - Dimension ICON

  • Analysis area XY 100x100 nm² to 90x90 µm² , Z max 7 µm 
  • Imaging resolution : X, Y, Z < nm
  • Environment : air or liquid
  • Large / high samples, 200 mm large stage
  • Stage programmation and repositioning
  • Modes : Contact, Tapping (Phase contrast), Electric (SCM, SSRM, TUNA), Peak Force, QNM, Force Measurements
  • Tensile module for stretching under AFM
  • Maximum sample dimensions : Ø 300 mm, thickness 60 mm
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BRUKER - NV-MM8

  • Analysis area XY 1 nm² to 170x170 µm² , Z max 5 µm 
  • Imaging resolution : X, Y, Z < nm
  • Environment : air or liquid
  • Modes : Contact, Tapping (Phase contrast), Peak Force, QNM, Force Measurements
  • Maximum sample dimensions : Ø 10 mm, thickness 7 mm
 


 

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