AFM is used to get information on the sample topography, roughness with an X, Y, Z nanomteric resolution ; this technique, based on the contact between a small sensor and the surface, can also give informations about mechanical properties, adhesion properties, electrical or magnetical properties. 

Samples analyzed: all solid or semi solid material types (polymer, powders, metals, lasses, biological samples, textile, fibers, nanoparticles)