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AFM
Atomic Force Microscope (AFM)
AFM
is used to get information on the sample topography, roughness with an X, Y, Z nanomteric resolution ; this technique, based on the contact between a small sensor and the surface, can also give informations about mechanical properties, adhesion properties, electrical or magnetical properties.
Samples analyzed:
all solid or semi solid material types (polymer, powders, metals, lasses, biological samples, textile, fibers, nanoparticles)
BRUKER - Dimension ICON
Analysis area
XY
100x100 nm² to 90x90 µm² ,
Z
max 7 µm
Imaging resolution :
X, Y, Z < nm
Environment : air or liquid
Large / high samples, 200 mm large stage
Stage programmation and repositioning
Modes :
Contact
,
Tapping
(Phase contrast),
Electric
(SCM, SSRM, TUNA),
Peak Force
,
QNM
,
Force Measurements
Tensile module for stretching under AFM
Maximum sample dimensions : Ø 300 mm, thickness 60 mm
BRUKER - NV-MM8
Analysis area
XY
1 nm² to 170x170 µm² ,
Z
max 5 µm
Imaging resolution :
X, Y, Z < nm
Environment : air or liquid
Modes :
Contact
,
Tapping
(Phase contrast),
Peak Force
,
QNM
,
Force Measurements
Maximum sample dimensions : Ø 10 mm, thickness 7 mm