WORKSHOP SIM III - Thank you all!

Thank you all for this third gathering of SIM workshop, where industry and academic people were getting together in two days of technical communication around Surfaces and Interfaces in Materials. It was a pleasure to host this event and we were glad to welcome participants from all over the France and all over the Europe in this sunny region, in Provence, with well-developed program!

The programme consisted of 7 sessions:Sans-titre2.png
  • Day 1: Contamination and Surface Cleanliness, Chemical Imaging and Latest Innovations in Instrumentation
  • Day 2: Thin Films and Multi-layers, Interfaces in Composite Materials, Packaging and Surface Treatments
TESCAN ANALYTICS proposed a half day of discovery of analysis techniques this year: from physical principles to their applications for solving practical problems, by identifying their advantages, limitations and complementarities. Moreover, BRUKER proposed a free measuring workshop on 3D optical profilometer!

During these two days, the participants had the opportunity to visit the Expert'Labs center, to see the equipment of laboratories more closely, and to meet teams of partners: TESCAN ANALYTICS, POLYMEX and TERA ENVIRONMENT.

Once more we would like to thank you, all the participants and sponsors, that you have put your trust in us!