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Evaluation by XPS of the contribution of an atmospheric plasma treatment on the extreme surface chem
Identification of the chemical nature of polymer film by XPS
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Study of the deformation/cracking of a barrier coating on a flexible substrate
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Determination of the homogeneity of a PDMS plasma treatment on carbon fibres by XPS
Identification of contamination in polymers after recycling - ToF-SIMS
Imaging the composition of homeopathic granules by ToF-SIMS
Identification and localisation of contamination in a microelectronic component
Micrometric scale topography of a watch dial - PO3D
Localized adhesion mechanisms in an assembly (Tof-SIMS / AFM)
Measurement of the recovery rate of a cosmetic treatment on natural skin by XPS
3D morphology and mechanical properties of nanoparticles
Morphology, topography and chemical composition of Li-ion batteries
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Morphology, topography, crystal structure, chemical composition of polymers and composites - SEM/FIB
Morphology, topography, chemical composition of glass - SEM/FIB/EDX
Cleaning of a contaminated surface with the ToF-SIMS argon cluster gun
The argon cluster gun, an innovation for XPS profiles of coated glasses
Roughness analysis of breast prostheses by PO3D
Morphology, granulometry and chemical composition in pharmacology - SEM/FIB/EDX
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WEBINAR en replay - Applications Plasma FIB SEM (Xe)
WEBINAR en replay - Applications Plasma FIB SEM (Xe)
Jun/11/2022
Discover our webinar on the topic of the contribution of the latest generation of TESCAN Plasma SEM-FIB for the characterization of materials at different scales. It is presented by Jérémie SILVENT, Application Engineer TESCAN FRANCE.
https://bit.ly/3f8v2AL
Applications FIB SEM