EN
English
France
Toggle navigation
Applications
Your Materials
Your Thematics
Your Business Area
Surface Analytical Service
Techniques
XPS / ESCA
ToF-SIMS
AFM
TEM STEM EDX EELS
SEM EDX EBSD
FIB SEM Ga or Xe
Optical profilometry
Equipment
XPS
ToF-SIMS
AFM
TEM
SEM
FIB SEM
Optical Profilometer
Ultra Microtomy
Training
R&D
Collaborative projects
Dedicated developments
Partners
Communications
About
News
Events
Ask a quote
Contact
Tescan
/
About
/
News
/
A new XPS Equipment for TESCAN ANALYTICS !
A new XPS Equipment for TESCAN ANALYTICS !
Jan/02/2020
In order to fit customer needs, TESCAN ANALYTICS decided to enlarge its equipment array with a new
XPS AXIS NOVA, Kratos
with a
Gas Cluster Ion Source
. The equipment has been installed, tested : it is yet fully ready to take on new exciting challenges on your samples !
This equipment opens new possibilities, particularly on organic materials. On these materials, classical milling for depth profiling modifies the chemical information, and is often not optimal. The use of this new Gas Cluster Ion Source now allows to mill without damaging the chemical information and can also be used to access the chemical speciation while profiling. In addition, Gas Cluster Ion Beam allows to clean contaminated samples surface without damaging the sub surface of interest.
Some examples
here
Feel free to contact us for more informations: chrystelle.reynaud@tescan.com