A new XPS Equipment for TESCAN ANALYTICS !

In order to fit customer needs, TESCAN ANALYTICS decided to enlarge its equipment array with a new XPS AXIS NOVA, Kratos with a Gas Cluster Ion Source. The equipment has been installed, tested : it is yet fully ready to take on new exciting challenges on your samples !
This equipment opens new possibilities, particularly on organic materials. On these materials, classical milling for depth profiling modifies the chemical information, and is often not optimal. The use of this new Gas Cluster Ion Source now allows to mill without damaging the chemical information and can also be used to access the chemical speciation while profiling. In addition, Gas Cluster Ion Beam allows to clean contaminated samples surface without damaging the sub surface of interest. 
Some examples here

Feel free to contact us for more informations: chrystelle.reynaud@tescan.com