Dynamic X-ray tomography

Sep/21/2022
DynaTOM represents a major breakthrough in materials science and Earth sciences. It is the first laboratory micro-CT system designed specifically for accelerated, in situ and dynamic experiments. This accelerated imaging technology enables non-destructive exploration of the 4D evolution of materials and samples in their real environment, a goal that has been sought for decades in the field of X-ray tomography.
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Study of the evolution of the structure of a beer foam with the DynaTOM, showing 3 segments in a series of dynamic tomograms acquired continuously. Time resolution: 9 seconds per rotation.
 
TESCAN has pushed back the boundaries of traditional micro-CT designs by developing DynaTOM, a micro-CT imaging platform designed to open up new perspectives in scientific research and its applications thanks to dynamic tomography. This technology enables simulations to be validated using complex 3D experiments over time. The horizontal arrangement of the source and detector makes the equipment easy to use in situ, while dedicated interfaces simplify data acquisition and reprocessing.

DynaTOM provides true 4D imaging with high temporal resolution and continuous, uninterrupted scanning, offering features similar to those found in synchrotron-type laboratory facilities.

Continuous rotation of the source and detector ensures uninterrupted data collection, while a high frame rate detector enables high scan rates with sub-10 second temporal resolution. Reconstruction during the experiment using dynamic CT reduces the number of iterations for a successful test.

This technology enables uninterrupted tensile and compressive studies of alloys and composite materials, as well as the observation of flows, the study of crack propagation and fracture mechanics in various materials.

Other applications include the study of hydration in porous materials, crystal growth and mineralisation in geomaterials and construction materials, and condensation, melting and heating cycles in food applications.
Expertise, responsiveness and quality are the values upheld by TESCAN ANALYTICS. Don't hesitate to entrust us with your X-ray tomography analyses, request a free quote. To find out more about this technique, click here.

We also offer analytical services for the following techniques: AFM, FIB SEM Ga or Xe, SEM EDX EBSD, MET STEM EDX EELS, optical profilometry, XPS or FTIR.