EN
English
France
Toggle navigation
Your industries
Aerospace
Automotive
Microelectronics
Medical device
Pharmaceutical
Cosmetic
Polymer/Plastics processing
Luxury industry
Your applications
Your materials
Biomaterials
Ceramics
Thin layers
Metals
Nanoparticles
Polymers
Semiconductors
Textiles
Glass
Your thematics
Evaluation by XPS of the contribution of an atmospheric plasma treatment on the extreme surface chem
Identification of the chemical nature of polymer film by XPS
Characterization of single- to multi-layer surface treatments - ToF-SIMS
Aromatic compound mapping - ToF-SIMS
Study of the deformation/cracking of a barrier coating on a flexible substrate
XPS evaluation of oxidation degrees
Determination of the homogeneity of a PDMS plasma treatment on carbon fibres by XPS
Identification of contamination in polymers after recycling - ToF-SIMS
Imaging the composition of homeopathic granules by ToF-SIMS
Identification and localisation of contamination in a microelectronic component
Micrometric scale topography of a watch dial - PO3D
Localized adhesion mechanisms in an assembly (Tof-SIMS / AFM)
Measurement of the recovery rate of a cosmetic treatment on natural skin by XPS
3D morphology and mechanical properties of nanoparticles
Morphology, topography and chemical composition of Li-ion batteries
Morphology, topography, chemical composition of wood, textile and paper - SEM/FIB/EDX
Morphology and chemical composition of ceramics - SEM/FIB/EDX
Morphology, topography, crystal structure, chemical composition of civil engineering materials - SEM
Morphology, topography, crystal structure, chemical composition of polymers and composites - SEM/FIB
Morphology, topography, chemical composition of glass - SEM/FIB/EDX
Cleaning of a contaminated surface with the ToF-SIMS argon cluster gun
The argon cluster gun, an innovation for XPS profiles of coated glasses
Roughness analysis of breast prostheses by PO3D
Morphology, granulometry and chemical composition in pharmacology - SEM/FIB/EDX
Our techniques
AFM
FIB MEB Ga ou Xe
MicroFTIR
Optical profilometry
SEM EDX EBSD
TEM STEM EDX EELS
ToF-SIMS
Tomography X
XPS/ESCA
Training
Ask a quote
R&D
Collaboration
Partner
Communication
About
Contact
News
Events
Biophy Research
/
About
/
News
/
Dynamic X-ray tomography
Dynamic X-ray tomography
Sep/21/2022
DynaTOM represents a major breakthrough in materials science and Earth sciences. It is the first laboratory micro-CT system designed specifically for accelerated, in situ and dynamic experiments. This accelerated imaging technology enables non-destructive exploration of the 4D evolution of materials and samples in their real environment, a goal that has been sought for decades in the field of X-ray tomography.
Study of the evolution of the structure of a beer foam with the DynaTOM, showing 3 segments in a series of dynamic tomograms acquired continuously. Time resolution: 9 seconds per rotation.
TESCAN has pushed back the boundaries of traditional micro-CT designs by developing DynaTOM, a micro-CT imaging platform designed to open up new perspectives in scientific research and its applications thanks to dynamic tomography. This technology enables simulations to be validated using complex 3D experiments over time. The horizontal arrangement of the source and detector makes the equipment easy to use in situ, while dedicated interfaces simplify data acquisition and reprocessing.
DynaTOM provides true 4D imaging with high temporal resolution and continuous, uninterrupted scanning, offering features similar to those found in synchrotron-type laboratory facilities.
Continuous rotation of the source and detector ensures uninterrupted data collection, while a high frame rate detector enables high scan rates with sub-10 second temporal resolution. Reconstruction during the experiment using dynamic CT reduces the number of iterations for a successful test.
This technology enables uninterrupted tensile and compressive studies of alloys and composite materials, as well as the observation of flows, the study of crack propagation and fracture mechanics in various materials.
Other applications include the study of hydration in porous materials, crystal growth and mineralisation in geomaterials and construction materials, and condensation, melting and heating cycles in food applications.
Expertise, responsiveness and quality are the values upheld by TESCAN ANALYTICS. Don't hesitate to entrust us with your X-ray tomography analyses, request a free quote. To find out more about this technique, click here.
We also offer analytical services for the following techniques: AFM, FIB SEM Ga or Xe, SEM EDX EBSD, MET STEM EDX EELS, optical profilometry, XPS or FTIR.
Request for analysis
Do you have any questions? Do not hesitate to contact us!