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Evaluation by XPS of the contribution of an atmospheric plasma treatment on the extreme surface chem
Identification of the chemical nature of polymer film by XPS
Characterization of single- to multi-layer surface treatments - ToF-SIMS
Aromatic compound mapping - ToF-SIMS
Study of the deformation/cracking of a barrier coating on a flexible substrate
XPS evaluation of oxidation degrees
Determination of the homogeneity of a PDMS plasma treatment on carbon fibres by XPS
Identification of contamination in polymers after recycling - ToF-SIMS
Imaging the composition of homeopathic granules by ToF-SIMS
Identification and localisation of contamination in a microelectronic component
Micrometric scale topography of a watch dial - PO3D
Localized adhesion mechanisms in an assembly (Tof-SIMS / AFM)
Measurement of the recovery rate of a cosmetic treatment on natural skin by XPS
3D morphology and mechanical properties of nanoparticles
Morphology, topography and chemical composition of Li-ion batteries
Morphology, topography, chemical composition of wood, textile and paper - SEM/FIB/EDX
Morphology and chemical composition of ceramics - SEM/FIB/EDX
Morphology, topography, crystal structure, chemical composition of civil engineering materials - SEM
Morphology, topography, crystal structure, chemical composition of polymers and composites - SEM/FIB
Morphology, topography, chemical composition of glass - SEM/FIB/EDX
Cleaning of a contaminated surface with the ToF-SIMS argon cluster gun
The argon cluster gun, an innovation for XPS profiles of coated glasses
Roughness analysis of breast prostheses by PO3D
Morphology, granulometry and chemical composition in pharmacology - SEM/FIB/EDX
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FIB MEB Ga ou Xe
MicroFTIR
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Tescan Analytics has been awarded CIR certification!
Tescan Analytics has been awarded CIR certification!
May/07/2024
The Research Tax Credit (Crédit d'Impôt Recherche) is a French tax incentive for companies that spend money on research and development. It is designed to support and encourage companies' research efforts.
The aim of the Research Tax Credit (CIR) is to encourage companies to invest in R&D by reimbursing part of these investments. The aim of this tax incentive is to increase and strengthen French competitiveness.
TESCAN ANALYTICS has been awarded CIR certification for the years 2023, 2024, 2025, 2026 and 2027.
Tescan Analytics thanks all its partners, customers and employees for their continued support in achieving its research and innovation objectives. This recognition reinforces our determination to remain at the forefront of technology and to deliver high quality solutions to our customers.
CIR certification, awarded by the French Ministry of Higher Education, Research and Innovation, attests to the quality of the research and development activities carried out by TESCAN ANYLTICS.
Expertise, responsiveness and quality are the values promoted by TESCAN ANALYTICS. Do not hesitate to entrust us with your analyses, request a free quote. To find out more about our techniques, click here.
We offer analytical services for the following techniques: AFM, ToF-SIMS, FIB SEM Ga or Xe, SEM EDX EBSD, MET STEM EDX EELS, Optical Profilometry, XPS or FTIR.
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Do you have any questions? Do not hesitate to contact us!