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The argon cluster gun, an innovation for XPS profiles of coated glasses
Evaluation by XPS of the contribution of an atmospheric plasma treatment on the extreme surface chem
Imaging the composition of homeopathic granules by ToF-SIMS
Roughness analysis of breast prostheses by PO3D
Identification of contamination in polymers after recycling
3D morphology and mechanical properties of nanoparticles
Localized adhesion mechanisms in an assembly (Tof-SIMS / AFM)
Cleaning of a contaminated surface with the ToF-SIMS argon cluster gun
Identification and localisation of contamination in a microelectronic component
Determination of the homogeneity of a PDMS plasma treatment on carbon fibres by XPS
Measurement of the recovery rate of a cosmetic treatment on natural skin by XPS
Identification of the chemical nature of polymer film by XPS
Study of the deformation/cracking of a barrier coating on a flexible substrate
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TESCAN ANALYTICS R&D program 2022: Acquisition of EDR technology for our ToF-SIMS
Sep/21/2022
XPS last generation, to go even further in surface analysis and interface
Sep/14/2022
Train yourself in surface characterization with experts!
As every year, TESCAN ANALYTICS offers you characterization training sessions...
Aug/08/2022
WEBINAR en replay - Applications Plasma FIB SEM (Xe)
Discover our webinar on the topic of the contribution of the latest...
Jun/11/2022
Corrosion Science publication - CEA SACLAY, Framatome, EDF R&D, TESCAN ANALYTICS
High temperature steam oxidation of chromium-coated zirconium-based alloys...
Mar/20/2020
SERGE FERRARI trusts TESCAN ANALYTICS : "More than a service: a scientific support"
N° 25 of 360 R&D magazine, France Innovation, enlights...
Jan/02/2020